Robust Local Thickness Estimation of Sub-Micrometer Specimen by 4D-STEM

Number of the records: 1

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SYSNO	0579321
Title	Robust Local Thickness Estimation of Sub-Micrometer Specimen by 4D-STEM
Author(s)	Skoupý, Radim (UPT-D)_{RID, ORCID, SAI} Boltje, D. B. (NL) Šlouf, Miroslav (UMCH-V) [MATER]_{RID, ORCID} Mrázová, Kateřina (UPT-D)_{SAI, ORCID, RID} Láznička, Tomáš (UPT-D)_{ORCID, RID, SAI} Taisne, C. M. (NL) Krzyžánek, Vladislav (UPT-D)_{RID, ORCID, SAI} Hoogenboom, J. P. (NL) Jakobi, A. J. (NL)
Corespondence/senior	Krzyžánek, Vladislav - Korespondující autor Hoogenboom, J. P. - Korespondující autor Jakobi, A. J. - Korespondující autor
Source Title	Small Methods. Roč. 7, č. 9 (2023). - : Wiley
Article number	2300258
Document Type	Článek v odborném periodiku
Grant	GA21-13541S GA ČR - Czech Science Foundation (CSF), CZ - Czech Republic
	TN01000008 GA TA ČR - Technology Agency of the Czech Republic (TA ČR), CZ - Czech Republic
Institutional support	UPT-D - RVO:68081731 ; UMCH-V - RVO:61389013
Language	eng
Country	US
Keywords	4D-STEM * cryo-ET * FIB milling * TEM analysis
Cooperating institutions	Delft University of Technology (Netherlands)
URL	https://onlinelibrary.wiley.com/doi/10.1002/smtd.202300258
Permanent Link	https://hdl.handle.net/11104/0348160

Number of the records: 1