Number of the records: 1
Robust Local Thickness Estimation of Sub-Micrometer Specimen by 4D-STEM
- 1.Skoupý, Radim - Boltje, D. B. - Šlouf, Miroslav - Mrázová, Kateřina - Láznička, Tomáš - Taisne, C. M. - Krzyžánek, Vladislav - Hoogenboom, J. P. - Jakobi, A. J.
Robust Local Thickness Estimation of Sub-Micrometer Specimen by 4D-STEM.
Small Methods. Roč. 7, č. 9 (2023), č. článku 2300258. ISSN 2366-9608. E-ISSN 2366-9608
OECD category: Electrical and electronic engineering
Impact factor: 12.4, year: 2022
Method of publishing: Open access
https://onlinelibrary.wiley.com/doi/10.1002/smtd.202300258
https://hdl.handle.net/11104/0348160
Number of the records: 1