Bulk and interface second harmonic generation in the Si3N4 thin films deposited via ion beam sputtering

Number of the records: 1

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SYSNO	0555694
Title	Bulk and interface second harmonic generation in the Si3N4 thin films deposited via ion beam sputtering
Author(s)	Das, Nirmal Kumar (UFP-V) [TOPTEC] Kanclíř, Vít (UFP-V) [TOPTEC] Mokrý, Pavel (UFP-V) [TOPTEC]_RID Žídek, Karel (UFP-V) [TOPTEC]_ORCID
Corespondence/senior	Das, Nirmal Kumar - Korespondující autor
Source Title	Journal of Optics. Roč. 23, č. 2 (2021). - : Institute of Physics Publishing
Article number	024003
Document Type	Článek v odborném periodiku
Grant	ERC100431901, CZ - Czech Republic
	EF16_026/0008390 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic
	GA19-22000S GA ČR - Czech Science Foundation (CSF), CZ - Czech Republic
Institutional support	UFP-V - RVO:61389021
Language	eng
Country	GB
Keywords	silicon nitride * thin films * ellipsometry * second harmonic generation (SHG) * bulk * interface
URL	https://iopscience.iop.org/article/10.1088/2040-8986/abe450
Permanent Link	http://hdl.handle.net/11104/0330158

Number of the records: 1