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Effect of native oxide on the crystal orientation contrast in SEM micrographs obtained at hundreds, tens and units of eV

  1. 1.
    SYSNO0549396
    TitleEffect of native oxide on the crystal orientation contrast in SEM micrographs obtained at hundreds, tens and units of eV
    Author(s) Mikmeková, Šárka (UPT-D) RID, SAI, ORCID
    Aoyama, T. (JP)
    Corespondence/seniorMikmeková, Šárka - Korespondující autor
    Source Title Ultramicroscopy. Roč. 220, January (2021). - : Elsevier
    Article number113144
    Document TypeČlánek v odborném periodiku
    Grant TN01000008 GA TA ČR - Technology Agency of the Czech Republic (TA ČR), CZ - Czech Republic
    Institutional supportUPT-D - RVO:68081731
    Languageeng
    CountryNL
    Keywords SLEEM * Crystallographic contrast * Low-energy electrons * Mirror microscopy * Work function * Surface potential
    Cooperating institutions JFE Steel Corporation (Japan)
    URLhttps://www.sciencedirect.com/science/article/pii/S0304399120302928?via%3Dihub
    Permanent Linkhttp://hdl.handle.net/11104/0325415
     
Number of the records: 1  

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