Number of the records: 1
Effect of native oxide on the crystal orientation contrast in SEM micrographs obtained at hundreds, tens and units of eV
SYS 0549396 LBL 01000a^^22220027750^450 005 20240103230308.0 014 $a 85093933635 $2 SCOPUS 014 $a 33126106 $2 PUBMED 014 $a 000600833500006 $2 WOS 017 70
$a 10.1016/j.ultramic.2020.113144 $2 DOI 100 $a 20211209d m y slo 03 ba 101 0-
$a eng $d eng 102 $a NL 200 1-
$a Effect of native oxide on the crystal orientation contrast in SEM micrographs obtained at hundreds, tens and units of eV 215 $a 6 s. $c P 463 -1
$1 001 cav_un_epca*0257685 $1 011 $a 0304-3991 $e 1879-2723 $1 200 1 $a Ultramicroscopy $v Roč. 220, January (2021) $1 210 $c Elsevier 608 $a Article 610 $a SLEEM 610 $a Crystallographic contrast 610 $a Low-energy electrons 610 $a Mirror microscopy 610 $a Work function 610 $a Surface potential 700 -1
$3 cav_un_auth*0244354 $a Mikmeková $b Šárka $p UPT-D $i D1: Elektronová mikroskopie $j D1: Electron Microscopy $4 070 $z K $T Ústav přístrojové techniky AV ČR, v. v. i. 701 -1
$3 cav_un_auth*0314548 $a Aoyama $b T. $y JP $4 070 $q JFE Steel Corp, Steel Res Lab, 1 Kokan Cho, Fukuyama, Hiroshima 7218510, Japan, 856 $u https://www.sciencedirect.com/science/article/pii/S0304399120302928?via%3Dihub $9 RIV
Number of the records: 1