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Influence of Surface Polarity on Optoelectronic Properties of PEDOT:PSS/ZnO Hybrid Heterojunctions
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SYSNO ASEP 0543279 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Influence of Surface Polarity on Optoelectronic Properties of PEDOT:PSS/ZnO Hybrid Heterojunctions Author(s) Yatskiv, Roman (URE-Y) RID, ORCID
Grym, Jan (URE-Y)
Tiagulskyi, Stanislav (URE-Y)
Bašinová, Nikola (URE-Y)Number of authors 4 Article number 2000612 Source Title Physica Status Solidi A : Applications and Materials Science. - : Wiley - ISSN 1862-6300
Roč. 218, č. 6 (2021)Number of pages 7 s. Publication form Print - P Language eng - English Country DE - Germany Keywords hybrid heterojunctions ; current–voltage characteristics ; poly(3,4-ethylenedioxythiophene)poly(4-styrenesulfonate) ; zinc oxide Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering OECD category Electrical and electronic engineering Method of publishing Open access Institutional support URE-Y - RVO:67985882 UT WOS 000609057000001 DOI 10.1002/pssa.202000612 Annotation The influence of polar and nonpolar crystallographic orientations of ZnO substrates on the current transport mechanism in poly(3,4-ethylenedioxythiophene) poly(4-styrenesulfonate) (PEDOT:PSS)/ ZnO heterojunctions is investigated by DC and AC electrical measurements. It is shown that PEDOT:PSS forms high-quality rectifying junctions on nonpolar planes of n-type ZnO substrates, whereas on polar c-planes, the quality of the junction is affected by the surface polarity, with lower-quality junctions formed on the O-polar c-plane. The lower quality of the junction is attributed to partial degradation of the O-polar surface caused by the acidic nature of PEDOT:PSS. By the analysis of current-voltage characteristics, it is demonstrated that the recombination-tunneling mechanism dominates charge transport in the forward direction. An equivalent circuit is proposed to interpret the data obtained by impedance spectroscopy and the parameters of the equivalent circuit are extracted Workplace Institute of Radio Engineering and Electronics Contact Petr Vacek, vacek@ufe.cz, Tel.: 266 773 413, 266 773 438, 266 773 488 Year of Publishing 2022 Electronic address https://doi.org/10.1002/pssa.202000612
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