Comparison of segmentation of 2D and 3D EBSD measurements in polycrystalline materials

0543080 - FZÚ 2022 RIV SK eng J - Journal Article
Staněk, J. - Kopeček, Jaromír - Král, Petr - Karafiátová, I. - Seitl, F. - Beneš, V.
Comparison of segmentation of 2D and 3D EBSD measurements in polycrystalline materials.
Kovové materiály. Roč. 58, č. 5 (2020), s. 301-319. ISSN 0023-432X. E-ISSN 1338-4252
R&D Projects: GA ČR GC17-00393J
Institutional support: RVO:68378271 ; RVO:68081723
Keywords : microstructure * electron backscatter diffraction (EBSD) * grain boundaries * misorientation * tessellation
OECD category: Materials engineering; Materials engineering (UFM-A)
Impact factor: 1.068, year: 2020
Method of publishing: Open access

A comparison study of grain segmentation in 2D and 3D electron backscatter diffraction (EBSD) measurements of polycrystalline materials, based on a misorientation threshold, is presented. Using Laguerre tessellations with orientation marks, a simulation study that demonstrates a different sensitivity of segmentation in the case of low angle and high angle grain boundaries is involved. Then two metallic materials measured by 3D EBSD are investigated concerning segmentation, and there are given some recommendations for the misorientation thresholds. Computational tools such as DREAM 3D software enable significant data evaluation that is completed by a five-parameter analysis of grain boundaries.

Permanent Link: http://hdl.handle.net/11104/0322251