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XPS as an advanced method for analysis of organic materials
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SYSNO ASEP 0540756 Document Type A - Abstract R&D Document Type O - Ostatní Title XPS as an advanced method for analysis of organic materials Author(s) Artemenko, Anna (FZU-D) RID, ORCID
Štenclová, Pavla (FZU-D) ORCID
Babčenko, Oleg (FZU-D) ORCID
Wågberg, T. (SE)
Segervald, J. (SE)
Jia, X. (SE)
Shchukarev, A. (SE)
Marton, M. (SK)
Vojs, M. (SK)
Kromka, Alexander (FZU-D) RID, ORCID, SAINumber of authors 10 Source Title Book of Abstracts of the 30th Joint Seminar of the Development of Materials Science in Research and Education. - Praha : Institute of Physics of the Czech Academy of Sciences, 2020 / Kožíšek Z. ; Král R. ; Zemenová P. - ISBN 978-80-907237-1-9
S. 17-17Number of pages 1 s. Publication form Online - E Action Joint Seminar of the Development of Materials Science in Research and Education /30./ Event date 07.09.2020 - 11.09.2020 VEvent location Pavlov Country CZ - Czech Republic Event type EUR Language eng - English Country CZ - Czech Republic Keywords XPS ; amino acids ; diamond ; DLC ; cryogenic Subject RIV BM - Solid Matter Physics ; Magnetism OECD category Physical chemistry R&D Projects EF18_053/0016627 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) GJ20-00925Y GA ČR - Czech Science Foundation (CSF) Institutional support FZU-D - RVO:68378271 Annotation XPS is known as a surface-sensitive method that allows us to obtain quantitative information about the chemical composition of organic materials. Here we present technological challenges in XPS analysis of AAs and cells (geobacter, Algae). The first part focuses on an understanding of the actual mechanisms of AAs interaction with H-/O-terminated NCD and DLC films using XPS. The detailed processing of XPS data revealed the dependence of AAs adhesion on the surface termination of carbon-based materials. The second part focuses on the investigation of intact interfaces of centrifuged wet pastes of geobacter and Algae followed by XPS at liquid nitrogen temperatures. The detailed XPS analysis of C 1s, O 1s, N 1s and S 2p peaks was discussed. This work was supported by project ESIF and MEYS (Project “FZU- researchers, technical and administrative staff mobility” – CZ.02.2.69/0.0/0.0/18_053/0016627), by project VEGA 1/0554/20 and by the Czech Science Foundation (project No. 20-00925Y). Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2021
Number of the records: 1