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High-Resolution Analysis Using Bent Perfect Crystal in Powder Diffraction: Part II
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SYSNO 0539686 Title High-Resolution Analysis Using Bent Perfect Crystal in Powder Diffraction: Part II Author(s) Mikula, Pavol (UJF-V) [ONF] RID, ORCID, SAI
Šaroun, Jan (UJF-V) [ONF] RID, ORCID, SAI
Stammers, James H. (UJF-V) [ONF]
Em, V. (RU)Corespondence/senior Mikula, Pavol - Korespondující autor Source Title Journal of Surface Investigation-X-Ray Synchrotron and Neutron Techniques. Roč. 14, SUPPL 1 (2020), s. 151-155. - : Pleiades Publishing Document Type Článek v odborném periodiku Grant LM2015056 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) LM2010011 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) LM2015048 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) Institutional support UJF-V - RVO:61389005 Language eng Country US Keywords powder diffraction * focusing * bent crystal analyzer URL https://doi.org/10.1134/S1027451020070332 Permanent Link http://hdl.handle.net/11104/0317397
Number of the records: 1