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High-Resolution Analysis Using Bent Perfect Crystal in Powder Diffraction: Part II
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SYSNO ASEP 0539686 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title High-Resolution Analysis Using Bent Perfect Crystal in Powder Diffraction: Part II Author(s) Mikula, Pavol (UJF-V) RID, ORCID, SAI
Šaroun, Jan (UJF-V) RID, ORCID, SAI
Stammers, James H. (UJF-V)
Em, V. (RU)Number of authors 4 Source Title Journal of Surface Investigation-X-Ray Synchrotron and Neutron Techniques. - : Pleiades Publishing - ISSN 1027-4510
Roč. 14, SUPPL 1 (2020), s. 151-155Number of pages 5 s. Publication form Print - P Language eng - English Country US - United States Keywords powder diffraction ; focusing ; bent crystal analyzer Subject RIV BM - Solid Matter Physics ; Magnetism OECD category Condensed matter physics (including formerly solid state physics, supercond.) R&D Projects LM2015056 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) LM2010011 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) LM2015048 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) Research Infrastructure Reactors LVR-15 and LR-0 II - 90120 - Centrum výzkumu Řež s.r.o. Method of publishing Limited access Institutional support UJF-V - RVO:61389005 UT WOS 000578828100031 EID SCOPUS 85092365508 DOI 10.1134/S1027451020070332 Annotation As a continuation of our recent studies of alpha-Fe(211) samples at a scattering angle of 2 theta(S)= 88 degrees (Part I), a three-axis setup using bent perfect crystal monochromator and several analyzers was tested in the diffraction study of polycrystalline alpha-Fe(110) pins with a diameter of 8 and 2 mm at a scattering angle of 2 theta(S)= 47.1 degrees. After realizing the focusing conditions in real and momentum space at a neutron wavelength of 0.162 nm, a high angular resolution was achieved up to FWHM(Delta d/d) = 1.4 x 10(-3)and FWHM(Delta d/d) = 2.5 x 10(-3)for alpha-Fe samples with a diameter of 2 and 8 mm, respectively. This resolution was obtained by using open beams, i.e., without Soller collimators within the used range of the curvatures of the analyzers. Such settings can be used in powder diffraction, namely, in studies of high-resolution residual stresses and/or analysis of diffraction profiles with a small difference in the lattice parameters or a small change due to the application of an external load. Workplace Nuclear Physics Institute Contact Markéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228 Year of Publishing 2021 Electronic address https://doi.org/10.1134/S1027451020070332
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