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High-Resolution Analysis Using Bent Perfect Crystal in Powder Diffraction: Part II
- 1.MIKULA, Pavol, ŠAROUN, Jan, STAMMERS, James H., EM, V. High-Resolution Analysis Using Bent Perfect Crystal in Powder Diffraction: Part II. Journal of Surface Investigation-X-Ray Synchrotron and Neutron Techniques. 2020, 14(SUPPL 1), 151-155. ISSN 1027-4510. Available: doi: 10.1134/S1027451020070332.
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