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Understanding Gas Phase Ion Chemistry Is the Key to Reliable Selected Ion Flow Tube-Mass Spectrometry Analyses

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    SYSNO ASEP0537005
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleUnderstanding Gas Phase Ion Chemistry Is the Key to Reliable Selected Ion Flow Tube-Mass Spectrometry Analyses
    Author(s) Smith, D. (GB)
    McEwan, M. J. (NZ)
    Španěl, Patrik (UFCH-W) RID, ORCID
    Source TitleAnalytical Chemistry. - : American Chemical Society - ISSN 0003-2700
    Roč. 92, č. 19 (2020), s. 12750-12762
    Number of pages13 s.
    Languageeng - English
    CountryUS - United States
    Keywordsptr-tof-ms ; sift-ms ; humid air ; organic-compounds ; exhaled breath ; o-2(+) ions ; no+ ; h3o+ ; quantification ; series
    Subject RIVCF - Physical ; Theoretical Chemistry
    OECD categoryPhysical chemistry
    Method of publishingLimited access
    Institutional supportUFCH-W - RVO:61388955
    UT WOS000580426800003
    EID SCOPUS85091735404
    DOI10.1021/acs.analchem.0c03050
    AnnotationIon-molecule reactions (IMR) are at the very core of trace gas analyses in modern chemical ionization (CI) mass spectrometer instruments, which are increasingly being used in diverse areas of research and industry. The focus of this Perspective is on the ion chemistry that underpins gas-phase analytical CI methods. Special attention is given to the soft chemical ionization method known as selected ion flow tube-mass spectrometry (SIFT-MS). The processes involved in the ion chemistry of the reagent cations, H3O+, NO+, and O-2(+center dot), and the anions, O-center dot, O-2(-center dot), OH-, and NO2-, are discussed in some detail. Stressed throughout is that an understanding of these processes is mandatory to obtain reliable analyses of humid gaseous media such as ambient air and exhaled breath. It is indicated that further research is needed to understand the consequences of replacing helium in some situations by the more readily available nitrogen as the carrier gas in SIFT-MS.
    WorkplaceJ. Heyrovsky Institute of Physical Chemistry
    ContactMichaela Knapová, michaela.knapova@jh-inst.cas.cz, Tel.: 266 053 196
    Year of Publishing2021
    Electronic addresshttp://hdl.handle.net/11104/0314768
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