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Effect of implantation of C, Si and Cu into ZrNb nanometric multilayers
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SYSNO ASEP 0525525 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title Effect of implantation of C, Si and Cu into ZrNb nanometric multilayers Author(s) Daghbouj, N. (CZ)
Karlík, M. (CZ)
Lorinčík, J. (CZ)
Polcar, T. (CZ)
Callisti, M. (GB)
Havránek, Vladimír (UJF-V) RID, SAI, ORCIDNumber of authors 6 Article number 949 Source Title METAL 2019 - 28th International Conference on Metallurgy and Materials, Conference Proceedings. - Ostrava : TANGER Ltd., 2019 - ISBN 978-80-87294-92-5 Pages č. 944 Number of pages 6 s. Publication form Print - P Action Metal 2019 - 28th International Conference on Metallurgy and Materials Event date 22.05.2019 - 24.05.2019 VEvent location Brno Country CZ - Czech Republic Event type WRD Language eng - English Country CZ - Czech Republic Keywords Zr/Nb multilayers ; ion irradiation ; strain ; XRD ; SIMS Subject RIV BM - Solid Matter Physics ; Magnetism OECD category Materials engineering R&D Projects EF16_013/0001812 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) LM2015056 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) Institutional support UJF-V - RVO:61389005 UT WOS 000539487400154 EID SCOPUS 85079395583 DOI https://doi.org/10.37904/metal.2019.735 Annotation Sputter-deposited Zr/Nb nanometric multilayer films with a periodicity (L) in the range from 6 to 167 nm were subjected to carbon, silicon and copper ion irradiation with low and high fluences at room temperature. The ion profiles, mechanical proprieties, and disordering behavior have been investigated by using a variety of experimental techniques (Secondary Ion Mass Spectrometry - SIMS, nanoindentation, X-ray diffraction - XRD, and scanning transmission electron microscopy - STEM). On the STEM bright field micrographs there is damage clearly visible on the surface side of the multilayer. Deeper, the most damaged and disordered zone, located close to the maximum ion concentration, was observed. The in-depth C and Si concentration profiles obtained from SIMS were not affected by the periodicity of the nanolayers. This is in accordance with SRIM simulations. XRD and electron diffraction analyses suggest a structural evolution in relation to L. After irradiation, Zr (0002) and Nb (110) reflexions overlap for L=6 nm. For the periodicity L > 6 nm the Zr (0002) peak is shifted to higher angles and Nb (110) peak is shifted to lower angles. Workplace Nuclear Physics Institute Contact Markéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228 Year of Publishing 2021
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