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Effect of implantation of C, Si and Cu into ZrNb nanometric multilayers
- 1.DAGHBOUJ, N., KARLÍK, M., LORINČÍK, J., POLCAR, T., CALLISTI, M., HAVRÁNEK, V. Effect of implantation of C, Si and Cu into ZrNb nanometric multilayers. In: METAL 2019 - 28th International Conference on Metallurgy and Materials, Conference Proceedings. Ostrava: TANGER Ltd., 2019, č. 944, č. článku 949. ISBN 978-80-87294-92-5. Available: https://doi.org/10.37904/metal.2019.735
Number of the records: 1