Number of the records: 1  

Statistical analysis of 2D patterns and its application to astrometry

  1. 1.
    SYSNO0519440
    TitleStatistical analysis of 2D patterns and its application to astrometry
    Author(s) Závada, Petr (FZU-D) RID, ORCID
    Píška, Karel (FZU-D) RID, ORCID
    Corespondence/seniorZávada, Petr - Korespondující autor
    Source Title Journal of Physics: Conference Series, 938. S. 1-6. - Bristol : IOP Publishing Ltd., 2017
    Conference Workshop on High Energy Spin Physics /17./, DSPIN 2017, 11.09.2017 - 15.09.2017, Dubna
    Article number012037
    Document TypeKonferenční příspěvek (zahraniční konf.)
    Institutional supportFZU-D - RVO:68378271
    Languageeng
    CountryGB
    Keywords dimension 2 * background: random, statistical * statistical analysis * gravitation * heavy ion * binary * star
    URLhttp://hdl.handle.net/11104/0304427
    Permanent Linkhttp://hdl.handle.net/11104/0304427
    FileDownloadSizeCommentaryVersionAccess
    0519440.pdf06.5 MBCC licencePublisher’s postprintopen-access
     
Number of the records: 1  

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