Number of the records: 1
Statistical analysis of 2D patterns and its application to astrometry
- 1.
SYSNO ASEP 0519440 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title Statistical analysis of 2D patterns and its application to astrometry Author(s) Závada, Petr (FZU-D) RID, ORCID
Píška, Karel (FZU-D) RID, ORCIDNumber of authors 2 Article number 012037 Source Title Journal of Physics: Conference Series, 938. - Bristol : IOP Publishing Ltd., 2017 - ISSN 1742-6588 Pages s. 1-6 Number of pages 6 s. Publication form Print - P Action Workshop on High Energy Spin Physics /17./, DSPIN 2017 Event date 11.09.2017 - 15.09.2017 VEvent location Dubna Country RU - Russian Federation Event type WRD Language eng - English Country GB - United Kingdom Keywords dimension 2 ; background: random, statistical ; statistical analysis ; gravitation ; heavy ion ; binary ; star Subject RIV BF - Elementary Particles and High Energy Physics OECD category Particles and field physics Institutional support FZU-D - RVO:68378271 UT WOS 000431620400037 EID SCOPUS 85040972602 DOI 10.1088/1742-6596/938/1/012037 Annotation A general statistical procedure for analysis of finite 2D patterns, inspired by analysis of heavy-ion data, is developed. The method is verified in the study of publicly available data obtained by the Gaia-ESA mission. We prove that the procedure can be sensitive to the limits of accuracy of measurement, but it can also clearly identify the real physical effects on the large background of random distributions. As an example, the method confirms presence of binary and ternary star systems in the studied data. At the same time the possibility of statistical detection of gravitational microlensing effect is discussed. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2020 Electronic address http://hdl.handle.net/11104/0304427
Number of the records: 1