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Statistical analysis of 2D patterns and its application to astrometry

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    SYSNO ASEP0519440
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleStatistical analysis of 2D patterns and its application to astrometry
    Author(s) Závada, Petr (FZU-D) RID, ORCID
    Píška, Karel (FZU-D) RID, ORCID
    Number of authors2
    Article number012037
    Source TitleJournal of Physics: Conference Series, 938. - Bristol : IOP Publishing Ltd., 2017 - ISSN 1742-6588
    Pagess. 1-6
    Number of pages6 s.
    Publication formPrint - P
    ActionWorkshop on High Energy Spin Physics /17./, DSPIN 2017
    Event date11.09.2017 - 15.09.2017
    VEvent locationDubna
    CountryRU - Russian Federation
    Event typeWRD
    Languageeng - English
    CountryGB - United Kingdom
    Keywordsdimension 2 ; background: random, statistical ; statistical analysis ; gravitation ; heavy ion ; binary ; star
    Subject RIVBF - Elementary Particles and High Energy Physics
    OECD categoryParticles and field physics
    Institutional supportFZU-D - RVO:68378271
    UT WOS000431620400037
    EID SCOPUS85040972602
    DOI10.1088/1742-6596/938/1/012037
    AnnotationA general statistical procedure for analysis of finite 2D patterns, inspired by analysis of heavy-ion data, is developed. The method is verified in the study of publicly available data obtained by the Gaia-ESA mission. We prove that the procedure can be sensitive to the limits of accuracy of measurement, but it can also clearly identify the real physical effects on the large background of random distributions. As an example, the method confirms presence of binary and ternary star systems in the studied data. At the same time the possibility of statistical detection of gravitational microlensing effect is discussed.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2020
    Electronic addresshttp://hdl.handle.net/11104/0304427
Number of the records: 1  

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