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Statistical analysis of 2D patterns and its application to astrometry

  1. 1.
    Závada, Petr - Píška, Karel
    Statistical analysis of 2D patterns and its application to astrometry.
    Journal of Physics: Conference Series. Vol. 938. Bristol: IOP Publishing Ltd., 2017, s. 1-6, č. článku 012037. ISSN 1742-6588.
    [Workshop on High Energy Spin Physics /17./, DSPIN 2017. Dubna (RU), 11.09.2017-15.09.2017]
    OECD category: Particles and field physics
    http://hdl.handle.net/11104/0304427
Number of the records: 1  

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