Number of the records: 1
Statistical analysis of 2D patterns and its application to astrometry
- 1.Závada, Petr - Píška, Karel
Statistical analysis of 2D patterns and its application to astrometry.
Journal of Physics: Conference Series. Vol. 938. Bristol: IOP Publishing Ltd., 2017, s. 1-6, č. článku 012037. ISSN 1742-6588.
[Workshop on High Energy Spin Physics /17./, DSPIN 2017. Dubna (RU), 11.09.2017-15.09.2017]
OECD category: Particles and field physics
http://hdl.handle.net/11104/0304427
Number of the records: 1