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Statistical analysis of 2D patterns and its application to astrometry
- 1.ZÁVADA, Petr, PÍŠKA, Karel. Statistical analysis of 2D patterns and its application to astrometry. In: Journal of Physics: Conference Series. Vol. 938. Bristol: IOP Publishing Ltd., 2017, s. 1-6, č. článku 012037. ISSN 1742-6588. Available: doi: 10.1088/1742-6596/938/1/012037.
Number of the records: 1