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SEM, TEM and SLEEM (scanning low energy electron microscopy) of CB2 steel after creep testing
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SYSNO ASEP 0507183 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title SEM, TEM and SLEEM (scanning low energy electron microscopy) of CB2 steel after creep testing Author(s) Kasl, J. (CZ)
Mikmeková, Šárka (UPT-D) RID, SAI, ORCID
Jandová, D. (CZ)Number of authors 3 Article number 012008 Source Title EMAS 2013 workshop. 13th Europhean workshop on modern developments and applications in microbeam analysis. - Bristol : IOP, 2014 - ISSN 1757-8981 Number of pages 10 s. Publication form Print - P Action European Workshop of the European-Microbeam-Analysis-Society on Modern Developments and Applications in Microbeam Analysis (EMAS) /13./ Event date 12.05.2013 - 16.05.2013 VEvent location Porto Country PT - Portugal Event type WRD Language eng - English Country GB - United Kingdom Keywords SEM ; SLEEM Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering OECD category Nano-materials (production and properties) R&D Projects TE01020118 GA TA ČR - Technology Agency of the Czech Republic (TA ČR) Institutional support UPT-D - RVO:68081731 UT WOS 000337273400008 EID SCOPUS 84902155208 DOI 10.1088/1757-899X/55/1/012008 Annotation The demand to produce electrical power with higher efficiency and with lower environmental pollution is leading to the use of new advanced materials in the production of power plant equipment. To understand the processes taking place in parts produced from these materials during their operation under severe conditions (such as high temperature, high stress, and environmental corrosion) requires detailed evaluation of their substructure. It is usually necessary to use transmission electron microscopy (TEM). However, this method is very exacting and time-consuming. So there is an effort to use new scanning electron microscopy techniques instead of TEM. One of them is scanning low energy electron microscopy (SLEEM). This paper deals with an assessment of the possibility to use SLEEM for describing the substructure of creep resistant steel CB2 after long-term creep testing. In the SLEEM images more information is contained about the microstructure of the material in comparison with standard scanning electron microscopy. Study of materials using slow and very slow electrons opens the way to better understanding their microstructures. Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2020
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