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SEM, TEM and SLEEM (scanning low energy electron microscopy) of CB2 steel after creep testing
- 1.Kasl, J., Mikmeková, Š., Jandová, D. SEM, TEM and SLEEM (scanning low energy electron microscopy) of CB2 steel after creep testing. In: EMAS 2013 workshop. 13th Europhean workshop on modern developments and applications in microbeam analysis. Bristol: IOP, 2014, č. článku 012008. IOP Conference Series-Materials Science and Engineering. ISSN 1757-8981. Available: doi: 10.1088/1757-899X/55/1/012008
Number of the records: 1