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Kelvin probe force microscopy
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SYSNO ASEP 0501462 Document Type M - Monograph Chapter R&D Document Type Monograph Chapter Title Imaging charge distribution within molecules by scanning probe microscopy Author(s) Ondráček, Martin (FZU-D) RID, ORCID
Hapala, Prokop (FZU-D) RID, ORCID
Švec, Martin (FZU-D) RID, ORCID
Jelínek, Pavel (FZU-D) RID, ORCIDNumber of authors 4 Source Title Kelvin probe force microscopy. - Cham : Springer International Publishing, 2018 / Sadewasser S. ; Glatzel T. - ISSN 0931-5195 - ISBN 978-3-319-75686-8 Pages s. 499-518 Number of pages 20 s. Number of pages 521 Publication form Print - P Language eng - English Country CH - Switzerland Keywords charge distribution ; surfaces ; molecules ; Kelvin probe force microscopy ; scanning quantum dot microscopy ; high resolution atomic force microscopy Subject RIV BM - Solid Matter Physics ; Magnetism OECD category Condensed matter physics (including formerly solid state physics, supercond.) R&D Projects GJ17-24210Y GA ČR - Czech Science Foundation (CSF) Institutional support FZU-D - RVO:68378271 EID SCOPUS 85043786762 DOI 10.1007/978-3-319-75687-5_16 Annotation Different methods which provide information about charge distribution at atomic or submolecular scale are discussed, including Kelvin probe force microscopy, scanning quantum dot microscopy or high-resolution imaging with functionalized tips. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2019
Number of the records: 1