Number of the records: 1  

Prospects of Scanning Low Energy Electron Microscopy in Material Science

  1. 1.
    SYSNO ASEP0501096
    Document TypeA - Abstract
    R&D Document TypeThe record was not marked in the RIV
    R&D Document TypeNení vybrán druh dokumentu
    TitleProspects of Scanning Low Energy Electron Microscopy in Material Science
    Author(s) Müllerová, Ilona (UPT-D) RID, SAI, ORCID
    Mikmeková, Šárka (UPT-D) RID, SAI, ORCID
    Materna Mikmeková, Eliška (UPT-D) ORCID, RID, SAI
    Frank, Luděk (UPT-D) RID, SAI, ORCID
    Matsuda, K. (JP)
    Number of authors5
    Source TitleMicroscopy - ISSN 2050-5698
    Roč. 67, S2 (2018), i18
    Number of pages1 s.
    Publication formPrint - P
    ActionSymposium of The Japanese Society of Microscopy /61./
    Event date11.03.2018 - 11.03.2018
    VEvent locationToyama
    CountryJP - Japan
    Event typeWRD
    Languageeng - English
    CountryGB - United Kingdom
    Keywordslow energy electrons ; precipitates
    Subject RIVJA - Electronics ; Optoelectronics, Electrical Engineering
    OECD categoryNano-materials (production and properties)
    R&D ProjectsTE01020118 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
    Institutional supportUPT-D - RVO:68081731
    DOI10.1093/jmicro/dfy060
    AnnotationProgress in material science is connected with a precise and accurate knowledge of a relationship between a material structure and its final properties. New, more sensitive method has to be developed to study modern materials. Low energy (<1 keV) and very low energy (<100 eV) scanning electron microscopy (SLEEM) is the excellent tool to study precipitates, surfaces, crystal orientations and even 2D materials in the scale of units of nm. The imaging of the structures is possible in the reflected and in the transmitted modes by one or multichannel detectors to distinguish the angular distribution of emitted electron trajectories. High contrast is obtained especially at very low primary beam energies and even atomic layers or extremely small crystals ca be imaged with high lateral resolution. SLEEM opens huge amount of new possibilities for materials characterization and brings novel information enabling development of advanced materials.
    WorkplaceInstitute of Scientific Instruments
    ContactMartina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
    Year of Publishing2019
Number of the records: 1  

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