Number of the records: 1
SMV-2018-21: Výpočet optiky XPS zdroje
- 1.Radlička, Tomáš
SMV-2018-21: Výpočet optiky XPS zdroje.
[SMV-2018-21: Calculation of electron optical properties of XPS source.]
Brno: FEI CZECH REPUBLIC, 2018. 5 s.
Source of funding: N - Non-public resources
OECD category: Communication engineering and systems
http://hdl.handle.net/11104/0291422
Number of the records: 1