Inelastic mean free path from raw data measured by low-energy electrons time-of-flight spectrometer

Number of the records: 1

1.

SYSNO	0494380
Title	Inelastic mean free path from raw data measured by low-energy electrons time-of-flight spectrometer
Author(s)	Zouhar, Martin (UPT-D)_{ORCID, RID, SAI} Radlička, Tomáš (UPT-D)_{RID, ORCID, SAI} Oral, Martin (UPT-D)_{RID, ORCID, SAI} Konvalina, Ivo (UPT-D)_{RID, ORCID, SAI}
Source Title	Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. S. 86-87. - Brno : Institute of Scientific Instruments The Czech Academy of Sciences, 2018
Conference	Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, 04.06.2018 - 08.06.2018, Skalský dvůr
Document Type	Konferenční příspěvek (zahraniční konf.)
Grant	TE01020118 GA TA ČR - Technology Agency of the Czech Republic (TA ČR), CZ - Czech Republic
Institutional support	UPT-D - RVO:68081731
Language	eng
Country	CZ
Keywords	electron microscopy * time of flight * inelastic mean free path * low energy
Permanent Link	http://hdl.handle.net/11104/0287642

Number of the records: 1