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Inelastic mean free path from raw data measured by low-energy electrons time-of-flight spectrometer
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SYSNO ASEP 0494380 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title Inelastic mean free path from raw data measured by low-energy electrons time-of-flight spectrometer Author(s) Zouhar, Martin (UPT-D) ORCID, RID, SAI
Radlička, Tomáš (UPT-D) RID, ORCID, SAI
Oral, Martin (UPT-D) RID, ORCID, SAI
Konvalina, Ivo (UPT-D) RID, ORCID, SAINumber of authors 4 Source Title Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. - Brno : Institute of Scientific Instruments The Czech Academy of Sciences, 2018 - ISBN 978-80-87441-23-7 Pages s. 86-87 Number of pages 2 s. Publication form Print - P Action Recent Trends in Charged Particle Optics and Surface Physics Instrumentation Event date 04.06.2018 - 08.06.2018 VEvent location Skalský dvůr Country CZ - Czech Republic Event type WRD Language eng - English Country CZ - Czech Republic Keywords electron microscopy ; time of flight ; inelastic mean free path ; low energy Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering OECD category Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect) R&D Projects TE01020118 GA TA ČR - Technology Agency of the Czech Republic (TA ČR) Institutional support UPT-D - RVO:68081731 UT WOS 000450591400034 Annotation The inelastic mean free path (IMFP) is a key parameter of electron transport in a solid. With
the rise of so-called meta-materials, materials of specific shape, such as 2D crystals, or
materials with tailored functionality for next-generation electronic devices, the investigation
of the IMFP is still topical and of high importance. This is true especially at low energies, landing energy of electrons below 100 eV, that are hard to study using well established
techniques of electron spectroscopy.Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2019
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