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Wide range dielectric and infrared spectroscopy of (Nb plus In) co-doped rutile ceramics
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SYSNO ASEP 0493522 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Wide range dielectric and infrared spectroscopy of (Nb plus In) co-doped rutile ceramics Author(s) Bovtun, Viktor (FZU-D) RID, ORCID, SAI
Petzelt, Jan (FZU-D) RID, ORCID, SAI
Kempa, Martin (FZU-D) RID, ORCID
Nuzhnyy, Dmitry (FZU-D) RID, ORCID
Savinov, Maxim (FZU-D) RID, ORCID
Kamba, Stanislav (FZU-D) RID, ORCID, SAI
Yee, S.M.M. (CA)
Crandles, D.A. (CA)Number of authors 8 Article number 075002 Source Title Physical Review Materials. - : American Physical Society - ISSN 2475-9953
Roč. 2, č. 7 (2018), s. 1-10Number of pages 10 s. Language eng - English Country US - United States Keywords dielectric and IR spectroscopy ; giant permittivity Subject RIV BM - Solid Matter Physics ; Magnetism OECD category Condensed matter physics (including formerly solid state physics, supercond.) R&D Projects EF16_019/0000760 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) GA18-09265S GA ČR - Czech Science Foundation (CSF) GA15-08389S GA ČR - Czech Science Foundation (CSF) Institutional support FZU-D - RVO:68378271 UT WOS 000440417500006 DOI 10.1103/PhysRevMaterials.2.075002 Annotation It is argued that the colossal dielectric permittivity reported by Hu et al. [Hu et al., Nat.Mater. 12, 821(2013)]has the same explanation as in the original colossal permittivity material CaCu3TiO4O12(CCTO), namely, a combination of the internal barrier layer capacitor (IBLC) and the surface barrier layer capacitor (SBLC) effects. The IBLC effect is caused by a microstructure consisting of insulating grain boundaries (thickness ˷ 1 nm and conductivity of ˷ 10-6 S/cm) surrounding interior regions of bulk conductivity approximately equal to 10-1 S/cm. The SBLC effect is the result of a depletion layer adjacent to the contacts approximately 100 nm thick with conductivity of 5*10-7 S/cm. The SBLC and IBLC effects give rise to dielectric relaxations in low-frequency and radiofrequency regions, respectively. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2019
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