0487218 - FZÚ 2018 RIV NL eng J - Journal Article
Wierzchowski, W. - Wieteska, K. - Sobierajski, R. - Klinger, D. - Pelka, J. - Zymierska, D. - Paulmann, C. - Hau-Riege, S.P. - London, R.A. - Graf, A. - Burian, Tomáš - Chalupský, Jaromír - Gaudin, J. - Krzywinski, J. - Moeller, S. - Messerschmidt, M. - Bozek, J. - Bostedt, C.
Synchrotron topographic evaluation of strain around craters generated by irradiation with X-ray pulses from free electron laser with different intensities.
Nuclear Instruments & Methods in Physics Research Section B. Roč. 364, Dec (2015), s. 20-26. ISSN 0168-583X. E-ISSN 1872-9584
Institutional support: RVO:68378271
Keywords : x-ray free electron laser * soft x-ray lasers * irradiation with femtosecond pulses * silicon
OECD category: Fluids and plasma physics (including surface physics)
Impact factor: 1.389, year: 2015

The silicon sample irradiated with femtosecond soft X-ray pulses has been studied with several synchrotron X-ray diffraction topographic methods at HASYLAB. The topographic investigation revealed characteristic images of the created craters included the inner region reflecting the X-rays at lower angle, coming most probably from part of the silicon melted during the irradiation. The melted region was surrounded by strained outer region, similar to those observed in the case of rod-like inclusion but less regular in view of some irregularity of the beam used for generation of the craters. The higher dose resulted in increasing diameter of the melted area of the crater and the range of the strained region around it. Some features of the monochromatic and white beam back reflection section images of the craters were reproduced in numerically simulated images approximating the strain field in the crater by a droplet containing uniformly distributed point inclusions.

Permanent Link: http://hdl.handle.net/11104/0281894