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Synthesis and dielectric properties of BaTi.sub.1-x./sub.Zr.sub.x./sub.O.sub.3./sub.-based ceramic and film materials

  1. 1.
    SYSNO ASEP0486509
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleSynthesis and dielectric properties of BaTi1-xZrxO3-based ceramic and film materials
    Author(s) Suslov, A. (UA)
    Durilin, D. (UA)
    Ovchar, O. (UA)
    Belous, A. (UA)
    Bovtun, Viktor (FZU-D) RID, ORCID, SAI
    Kempa, Martin (FZU-D) RID, ORCID
    Jancar, J. (SI)
    Spreitzer, M. (SI)
    Number of authors8
    Article number6873964
    Source TitleConference Proceedings of the IEEE 34th International Scientific Conference Electronics and Nanotechnology (ELNANO). - Washington D.C. : IEEE, 2014 - ISBN 978-1-4799-4580-1
    Pagess. 66-69
    Number of pages4 s.
    Publication formOnline - E
    Action34th International Scientific Conference Electronics and Nanotechnology (ELNANO)
    Event date15.04.2014 - 18.04.2014
    VEvent locationKyiv
    CountryUA - Ukraine
    Event typeWRD
    Languageeng - English
    CountryUS - United States
    Keywordsceramics ; films ; sol-gel ; dielectric ; microwave
    Subject RIVBM - Solid Matter Physics ; Magnetism
    OECD categoryCondensed matter physics (including formerly solid state physics, supercond.)
    R&D ProjectsGAP204/12/1163 GA ČR - Czech Science Foundation (CSF)
    Institutional supportFZU-D - RVO:68378271
    EID SCOPUS84906535714
    DOI10.1109/ELNANO.2014.6873964
    AnnotationThe process of formation of BZT solid solutions (0.2 ≤ x ≤ 0.5) with perovskite structure has been studied. The phase composition, microstructure and electrophysical properties of BZT ceramic and film materials have been investigated. It has been shown that when zirconium content of ceramic materials is increased, a decrease in permittivity and loss is observed. In this case, the nonlinearity factor retains high values (30-50%) in relatively weak electric fields (30-60 kV/cm). BaTi0.6Zr0.4O3 films have been obtained by solgel method. The dielectric properties of films in the microwave
    range have been investigated.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2018
Number of the records: 1  

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