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Laser source for dimensional metrology: investigation of an iodine stabilized system based on narrow linewidth 633 nm DBR diode

  1. 1.
    SYSNO ASEP0480451
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleLaser source for dimensional metrology: investigation of an iodine stabilized system based on narrow linewidth 633 nm DBR diode
    Author(s) Řeřucha, Šimon (UPT-D) RID, ORCID, SAI
    Yacoot, A. (GB)
    Pham, Minh Tuan (UPT-D) RID, ORCID, SAI
    Čížek, Martin (UPT-D) RID, ORCID, SAI
    Hucl, Václav (UPT-D) RID, ORCID, SAI
    Lazar, Josef (UPT-D) RID, ORCID, SAI
    Číp, Ondřej (UPT-D) RID, SAI, ORCID
    Number of authors7
    Article number045204
    Source TitleMeasurement Science and Technology. - : Institute of Physics Publishing - ISSN 0957-0233
    Roč. 28, č. 4 (2017), s. 1-11
    Number of pages11 s.
    Publication formPrint - P
    Languageeng - English
    CountryGB - United Kingdom
    Keywordsoptical metrology ; DBR laser diode ; frequency stabilization ; laser interferometry ; dimensional metrology ; iodine stabilization ; displacement measurement
    Subject RIVBH - Optics, Masers, Lasers
    OECD categoryOptics (including laser optics and quantum optics)
    R&D ProjectsGB14-36681G GA ČR - Czech Science Foundation (CSF)
    LO1212 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    ED0017/01/01 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    TE01020233 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
    Institutional supportUPT-D - RVO:68081731
    UT WOS000395878200002
    EID SCOPUS85014466742
    DOI10.1088/1361-6501/aa5ab9
    AnnotationWe demonstrated that an iodine stabilized distributed Bragg reflector (DBR) diode based laser system lasing at a wavelength in close proximity to lambda = 633 nm could be used as an alternative laser source to the helium-neon lasers in both scientific and industrial metrology. This yields additional advantages besides the optical frequency stability and coherence: inherent traceability, wider optical frequency tuning range, higher output power and high frequency modulation capability. We experimentally investigated the characteristics of the laser source in two major steps: first using a wavelength meter referenced to a frequency comb controlled with a hydrogen maser and then on an interferometric optical bench testbed where we compared the performance of the laser system with that of a traditional frequency stabilized He-Ne laser. The results indicate that DBR diode laser system provides a good laser source for applications in dimensional (nano) metrology, especially in conjunction with novel interferometric detection methods exploiting high frequency modulation or multiaxis measurement systems.
    WorkplaceInstitute of Scientific Instruments
    ContactMartina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
    Year of Publishing2018
Number of the records: 1  

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