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Laser source for dimensional metrology: investigation of an iodine stabilized system based on narrow linewidth 633 nm DBR diode
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SYSNO ASEP 0480451 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Laser source for dimensional metrology: investigation of an iodine stabilized system based on narrow linewidth 633 nm DBR diode Author(s) Řeřucha, Šimon (UPT-D) RID, ORCID, SAI
Yacoot, A. (GB)
Pham, Minh Tuan (UPT-D) RID, ORCID, SAI
Čížek, Martin (UPT-D) RID, ORCID, SAI
Hucl, Václav (UPT-D) RID, ORCID, SAI
Lazar, Josef (UPT-D) RID, ORCID, SAI
Číp, Ondřej (UPT-D) RID, SAI, ORCIDNumber of authors 7 Article number 045204 Source Title Measurement Science and Technology. - : Institute of Physics Publishing - ISSN 0957-0233
Roč. 28, č. 4 (2017), s. 1-11Number of pages 11 s. Publication form Print - P Language eng - English Country GB - United Kingdom Keywords optical metrology ; DBR laser diode ; frequency stabilization ; laser interferometry ; dimensional metrology ; iodine stabilization ; displacement measurement Subject RIV BH - Optics, Masers, Lasers OECD category Optics (including laser optics and quantum optics) R&D Projects GB14-36681G GA ČR - Czech Science Foundation (CSF) LO1212 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) ED0017/01/01 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) TE01020233 GA TA ČR - Technology Agency of the Czech Republic (TA ČR) Institutional support UPT-D - RVO:68081731 UT WOS 000395878200002 EID SCOPUS 85014466742 DOI 10.1088/1361-6501/aa5ab9 Annotation We demonstrated that an iodine stabilized distributed Bragg reflector (DBR) diode based laser system lasing at a wavelength in close proximity to lambda = 633 nm could be used as an alternative laser source to the helium-neon lasers in both scientific and industrial metrology. This yields additional advantages besides the optical frequency stability and coherence: inherent traceability, wider optical frequency tuning range, higher output power and high frequency modulation capability. We experimentally investigated the characteristics of the laser source in two major steps: first using a wavelength meter referenced to a frequency comb controlled with a hydrogen maser and then on an interferometric optical bench testbed where we compared the performance of the laser system with that of a traditional frequency stabilized He-Ne laser. The results indicate that DBR diode laser system provides a good laser source for applications in dimensional (nano) metrology, especially in conjunction with novel interferometric detection methods exploiting high frequency modulation or multiaxis measurement systems. Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2018
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