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DBR diode based laser source working at 633 nm for dimensional nanometrology
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SYSNO ASEP 0467526 Document Type A - Abstract R&D Document Type The record was not marked in the RIV R&D Document Type Není vybrán druh dokumentu Title DBR diode based laser source working at 633 nm for dimensional nanometrology Author(s) Řeřucha, Šimon (UPT-D) RID, ORCID, SAI
Pham, Minh Tuan (UPT-D) RID, ORCID, SAI
Čížek, Martin (UPT-D) RID, ORCID, SAI
Hucl, Václav (UPT-D) RID, ORCID, SAI
Lazar, Josef (UPT-D) RID, ORCID, SAI
Číp, Ondřej (UPT-D) RID, SAI, ORCID
Yacoot, A. (GB)Number of authors 7 Source Title NanoScale 2016. 11th Seminar on Quantitative Microscopy (QM) and 7th Seminar on Nanoscale Calibration Standards and Methods. - Wroclaw : Wroclaw University of Technology, 2016
S. 109-110Number of pages 2 s. Publication form Print - P Action NanoScale 2016. Seminar on Quantitative Microscopy (QM) /11./ and Seminar on Nanoscale Calibration Standards and Methods /7./ Event date 09.03.2016 - 11.03.2016 VEvent location Wroclaw Country PL - Poland Event type EUR Language eng - English Country PL - Poland Keywords laser metrology ; DBR laser diode ; laser interferometry ; displacement metrology ; laser system Subject RIV BH - Optics, Masers, Lasers R&D Projects LO1212 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) ED0017/01/01 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) GB14-36681G GA ČR - Czech Science Foundation (CSF) TE01020233 GA TA ČR - Technology Agency of the Czech Republic (TA ČR) Institutional support UPT-D - RVO:68081731 Annotation We have assembled an experimental iodine stabilized Distributed Bragg Reflector (DBR) diode based laser system lasing at a wavelength that is in a close proximity to the wavelength of a stabilized He-Ne lasers traditionally used for metrological applications. Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2017
Number of the records: 1