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Thin (111) oriented CoFe2O4 and Co3O4 films prepared by decomposition of layered cobaltates

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    SYSNO ASEP0458373
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleThin (111) oriented CoFe2O4 and Co3O4 films prepared by decomposition of layered cobaltates
    Author(s) Buršík, Josef (UACH-T) RID, ORCID, SAI
    Soroka, Miroslav (UACH-T) SAI, ORCID, RID
    Uhrecký, Róbert (UACH-T) SAI
    Kužel, R. (CZ)
    Mika, Filip (UPT-D) RID, SAI, ORCID
    Huber, Š. (CZ)
    Number of authors6
    Source TitleApplied Surface Science. - : Elsevier - ISSN 0169-4332
    Roč. 376, JUL (2016), s. 209-218
    Number of pages10 s.
    Languageeng - English
    CountryNL - Netherlands
    KeywordsLayered cobaltates ; Spinels ; Chemical solution deposition ; Thin films ; Oriented growth
    Subject RIVCA - Inorganic Chemistry
    Subject RIV - cooperationInstitute of Scientific Instruments - Computer Applications, Robotics
    R&D ProjectsGA14-18392S GA ČR - Czech Science Foundation (CSF)
    GA13-03708S GA ČR - Czech Science Foundation (CSF)
    Institutional supportUACH-T - RVO:61388980 ; UPT-D - RVO:68081731
    UT WOS000376699400026
    EID SCOPUS84962425635
    DOI10.1016/j.apsusc.2016.03.130
    AnnotationThe formation and structural characterization of highly (111)-oriented Co3O4 and CoFe2O4 films prepared by a novel procedure from 001-oriented NaCoO2 and Na(CoFe)O-2 is reported. The Na(CoFe)O-2 films were deposited on MgO, SrTiO3, LaAlO3, and Zr(Y)O-2 single crystals with (100) and (111) orientations by chemical solution deposition method and crystallized at 700 degrees C. Subsequently they were transformed into (111)-oriented spinel phase during post-growth annealing at 800-1000 degrees C. Morphology and structure of the films was investigated by means of scanning electron microscopy and X-ray diffraction. While all spinel films exhibit pronounced out-of-plane orientation irrespective of substrate, the rate of in-plane orientation strongly depend on lattice misfit values. Different epitaxial phenomena ranging from true one-to-one epitaxy to the existence of many-to-one epitaxy involving two or more orientations were determined by full 3D texture analysis.
    WorkplaceInstitute of Inorganic Chemistry
    ContactJana Kroneislová, krone@iic.cas.cz, Tel.: 311 236 931
    Year of Publishing2017
Number of the records: 1  

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