Number of the records: 1
Characterisation of silicon carbide layers formed during BNCD deposition
- 1.Taylor, Andrew - Ashcheulov, Petr - Čada, Martin - Drahokoupil, Jan - Fekete, Ladislav - Klimša, Ladislav - Olejníček, Jiří - Remeš, Zdeněk - Čtvrtlík, R. - Tomáštík, J. - Janíček, P. - Mistrík, J. - Kopeček, Jaromír - Mortet, Vincent
Characterisation of silicon carbide layers formed during BNCD deposition.
Diamond Conference. Coventry: University of Warwick, 2015. P6.1-P6.3
[De Beers Diamond Conference 2015. 06.07.2015-09.07.2015, Warwick]
http://hdl.handle.net/11104/0256994
Number of the records: 1