Number of the records: 1
Measurement of lattice parameters of single crystals and thin layers
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SYSNO 0432123 Title Measurement of lattice parameters of single crystals and thin layers Author(s) Drahokoupil, Jan (FZU-D) RID, ORCID
Veřtát, P. (CZ)
Richterová, Kristina (FZU-D)
Laufek, František (FZU-D) RIDSource Title Materials Structure in Chemistry, Biology, Physics and Technology. Roč. 21, č. 2 (2014), s. 97-97. - : Czech and Slovak Crystallographic Association Conference Struktura 2014 : kolokvium Krystalografické společnosti, Kutná Hora, 09.06.2014-12.06.2014 Document Type Abstrakt Institutional support FZU-D - RVO:68378271 Language eng Country CZ Keywords XRD * lattice parameters URL http://www.xray.cz/ms/bul2014-2/wednesday1.pdf Permanent Link http://hdl.handle.net/11104/0236601
Number of the records: 1