Number of the records: 1
Study of silicon nanostructures by microscopic methods
- 1.
SYSNO 0432079 Title Study of silicon nanostructures by microscopic methods Author(s) Hývl, Matěj (FZU-D) ORCID Issue data Praha: ČVUT, 2014 Academic degree Ing. Affiliation České vysoké učení technické v Praze, Fakulta jaderná a fyzikálně inženýrská Document Type Dizertace Grant M100101216, CZ - Czech Republic FR-TI2/736 GA MPO - Ministry of Industry and Trade (MPO) GA13-12386S GA ČR - Czech Science Foundation (CSF) LM2011026 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic GB14-37427G GA ČR - Czech Science Foundation (CSF) Institutional support FZU-D - RVO:68378271 Language eng Country CZ Keywords silicon nanostructures * AFM * Raman intensity mapping * nanoindentation * radial junctions * Si NWs * LPC polycrystalline silicon thin films Permanent Link http://hdl.handle.net/11104/0236555
Number of the records: 1