Number of the records: 1  

Deposition of Si:H thin films on transparent and conductive ZnOat boundary parameters of PECVD if Sn as catalyst element is used

  1. 1.
    SYSNO0424992
    TitleDeposition of Si:H thin films on transparent and conductive ZnOat boundary parameters of PECVD if Sn as catalyst element is used
    Author(s) Pham, T.T. (VN)
    Stuchlíková, The-Ha (FZU-D) RID, ORCID
    Ledinský, Martin (FZU-D) RID, ORCID, SAI
    Hruška, Karel (FZU-D) RID, ORCID
    Le, V.T.H. (VN)
    Stuchlík, Jiří (FZU-D) RID, ORCID
    Source Title ISPC - Proceedings International Symposium on Plasma Chemistry (ISPC 21). - Cairn : IPCS International Plasma Chemistry Society, 2013
    Conference International Symposium on Plasma Chemistry (ISPC 21)/21./, Cairns Convention Centre, 04.08.2013-09.08.2013
    Document TypeKonferenční příspěvek (zahraniční konf.)
    Grant M100101216, CZ - Czech Republic
    M100101217, CZ - Czech Republic
    GA203/09/1088 GA ČR - Czech Science Foundation (CSF)
    LH12236 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    Institutional supportFZU-D - RVO:68378271
    Languageeng
    CountryAU
    Keywords Si:H thin film * ZnO * PECVD * catalytic effect * Si-NWs
    URL http://www.ispc-conference.org/ispcproc/ispc21/ID396.pdf
    Permanent Linkhttp://hdl.handle.net/11104/0230960
     
Number of the records: 1  

  This site uses cookies to make them easier to browse. Learn more about how we use cookies.