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Investigation of Short-term Amplitude and Frequency Fluctuations of Lasers for Interferometry
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SYSNO ASEP 0397701 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Investigation of Short-term Amplitude and Frequency Fluctuations of Lasers for Interferometry Author(s) Hrabina, Jan (UPT-D) RID, ORCID, SAI
Lazar, Josef (UPT-D) RID, ORCID, SAI
Holá, Miroslava (UPT-D) RID, ORCID, SAI
Číp, Ondřej (UPT-D) RID, SAI, ORCIDNumber of authors 4 Source Title Measurement Science Review. - : Sciendo - ISSN 1335-8871
Roč. 13, č. 2 (2013), s. 63-69Number of pages 7 s. Publication form Print - P Language eng - English Country SK - Slovakia Keywords nanometrology ; laser noise ; AFM ; spectroscopy ; interferometry Subject RIV BH - Optics, Masers, Lasers R&D Projects GPP102/11/P820 GA ČR - Czech Science Foundation (CSF) GA102/09/1276 GA ČR - Czech Science Foundation (CSF) KAN311610701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) ED0017/01/01 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) LC06007 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) EE2.4.31.0016 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) TA02010711 GA TA ČR - Technology Agency of the Czech Republic (TA ČR) Institutional support UPT-D - RVO:68081731 UT WOS 000318150800003 EID SCOPUS 84879285234 DOI 10.2478/msr-2013-0014 Annotation One of the limiting factors of accuracy and resolution in laser interferometry is represented by noise properties of the laser powering the interferometer. Amplitude and especially frequency fluctuations of the laser source are crucial in precision distance measurement. Sufficiently high long-term frequency stability of the laser source must be achieved especially in applications in fundamental metrology. Furthermore, the short-term frequency variations are also important primarily for measurements done at high acquisition speeds. This contribution presents practical results of measurements of short-term amplitude and frequency noises of a set of laser sources commonly used in laser interferometry. The influence of the interferometer design and electrical parameters of the detection system are also discussed. Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2014
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