Number of the records: 1  

Determination of mechanical properties from microcompression test

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    SYSNO ASEP0387901
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleDetermination of mechanical properties from microcompression test
    Author(s) Truhlář, Michal (UFM-A)
    Kruml, Tomáš (UFM-A) RID, ORCID
    Kuběna, Ivo (UFM-A) RID, ORCID
    Petráčková, Klára (UFM-A)
    Náhlík, Luboš (UFM-A) RID, ORCID
    Number of authors5
    Source TitleEngineering Mechanics 2012. - Prague : ITAM AS CR, v. v. i., 2012 / Náprstek J. ; Fischer C. - ISBN 978-80-86246-40-6
    Pagess. 1435-1440
    Number of pages6 s.
    Publication formMedium - C
    ActionEngineering Mechanics 2012 /18./
    Event date14.05.2012-17.05.2012
    VEvent locationSvratka
    CountryCZ - Czech Republic
    Event typeEUR
    Languageeng - English
    CountryCZ - Czech Republic
    Keywordsmicrocompression ; thin film properties ; focused ion beam ; Young modulus ; FEM
    Subject RIVJL - Materials Fatigue, Friction Mechanics
    Institutional supportUFM-A - RVO:68081723
    AnnotationThis paper describes a microcompression test of Al - 1.5 wt. % Cu thin film deposited on Si substrate. Microcompression combines the sample preparation with the use of ion focused beam (FIB) with a compression test carried out using nanoindenter. Cylindrical specimens (pillars) were prepared using FIB. The diameter of pillars was about 1.3 μm and their height was about 2 μm (equal to the film thickness). Stress-strain curves of the thin film were obtained. The results depend on crystallographic orientation of pillar. The paper is focused to an attempt to determine as precisely as possible Young modulus of the film using experimental data and finite element modelling.
    WorkplaceInstitute of Physics of Materials
    ContactYvonna Šrámková, sramkova@ipm.cz, Tel.: 532 290 485
    Year of Publishing2013
Number of the records: 1  

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