Applications of the Scanning Low Energy Electron Microscope

Number of the records: 1

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SYSNO ASEP	0379913
Document Type	J - Journal Article
R&D Document Type	Journal Article
Subsidiary J	Ostatní články
Title	Applications of the Scanning Low Energy Electron Microscope
Author(s)	Müllerová, Ilona (UPT-D)_{RID, SAI, ORCID} Mikmeková, Eliška (UPT-D)_RID Mikmeková, Šárka (UPT-D)_{RID, SAI, ORCID} Hovorka, Miloš (UPT-D) Frank, Luděk (UPT-D)_{RID, SAI, ORCID}
Number of authors	5
Source Title	Microscopy and Microanalysis. - : Cambridge University Press - ISSN 1431-9276 Roč. 18, S2 (2012), s. 996-997
Number of pages	2 s.
Language	eng - English
Country	US - United States
Keywords	scanning low energy electron microscope ; cathode lens
Subject RIV	JA - Electronics ; Optoelectronics, Electrical Engineering
R&D Projects	FR-TI3/323 GA MPO - Ministry of Industry and Trade (MPO)
	ED0017/01/01 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
Institutional support	UPT-D - RVO:68081731
DOI	10.1017/S1431927612006836
Annotation	Recent applications of the Scanning Low Energy Electron Microscope (SLEEM) are presented. The device employs the electron signal reflected from the specimen as well as that transmitted through the specimen for observation throughout the full energy scale down to units of electronvolts.
Workplace	Institute of Scientific Instruments
Contact	Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
Year of Publishing	2012

Number of the records: 1