Fourier Transforms - New Analytical Approaches and FTIR Strategies

0375299 - FZÚ 2012 RIV HR eng M - Monography Chapter
Holovský, Jakub
Fourier transform photocurrent spectroscopy on non-crystalline semiconductors.
Fourier Transforms - New Analytical Approaches and FTIR Strategies. Rijeka: InTech, 2011 - (Nikolic, G.), s. 257-282. ISBN 978-953-307-232-6
R&D Projects: GA ČR GD202/09/H041; GA MŠMT(CZ) 7E09057; GA ČR GA202/09/0417
EU Projects: European Commission(XE) 214134 - N2P
Institutional research plan: CEZ:AV0Z10100521
Keywords : Fourier transform * photocurrent * spectroscopy of semiconductors * thin film silicon * nanodiamond
Subject RIV: BM - Solid Matter Physics ; Magnetism
http://www.intechopen.com/articles/show/title/fourier-transform-photocurrent-spectroscopy-on-non-crystalline-semiconductors

The chapter briefly reviewes its today’s level of use of Fourier Transform Photocurrent Spectroscopy and more basically explaines the general principles and conditions of use. Principal advantages of F-T allow maintaining special condition of measurement such as constant photocurrent or constant illumination or allow achievement of high intensities. Method has so far been used for variety of materials: thin film silicon, nanocrystalline diamond, organic semiconductors and CIS compounds. In a laboratory FTPS can be sometimes replaced by CPM method (in most cases) or by Photothermal Deflection Spectroscopy (only non-absorbing substrates, lower sensitivity requirements) and its advantage over these methods is speed and sensitivity. Its disadvantage is wavelength dependent modulation frequency in range of kHz that requires correction procedure. Despite that FTPS method has been proven to be useful in many scientific and also one industrial application.
Permanent Link: http://hdl.handle.net/11104/0207992