Number of the records: 1
Determination of single microcrystalline silicon grains preferential crystallographic orientation by polarized Raman spectroscopy
- 1.Ledinský, Martin - Vetushka, Aliaksi - Stuchlík, Jiří - Fejfar, Antonín - Kočka, Jan
Determination of single microcrystalline silicon grains preferential crystallographic orientation by polarized Raman spectroscopy.
XXII International Conference on Raman Spectroscopy. Melville: AIP, 2010 - (Champion, P.; Ziegler, L.), s. 1109-1110. AIP Conference Proceedings, 1267. ISBN 978-0-7354-0818-0.
[International Conference on Raman Spectroscopy /22./. Boston (US), 08.08.2010-13.08.2010]
http://hdl.handle.net/11104/0206807
Number of the records: 1