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Prospects of the scanning low energy electron microscopy in materials science
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SYSNO ASEP 0367162 Document Type K - Proceedings Paper (Czech conf.) R&D Document Type The record was not marked in the RIV Title Prospects of the scanning low energy electron microscopy in materials science Author(s) Frank, Luděk (UPT-D) RID, SAI, ORCID
Mikmeková, Šárka (UPT-D) RID, SAI, ORCID
Konvalina, Ivo (UPT-D) RID, ORCID, SAI
Müllerová, Ilona (UPT-D) RID, SAI, ORCID
Hovorka, Miloš (UPT-D)Number of authors 5 Source Title Mikroskopie 2011. - Nové Město na Moravě : Československá mikroskopická společnost, 2011 / Frank L. ; Hozák P. - ISBN N
S. 42Number of pages 1 s. Action Mikroskopie 2011 Event date 17.02.2011-18.02.2011 VEvent location Nové Město na Moravě Country CZ - Czech Republic Event type EUR Language eng - English Country CZ - Czech Republic Keywords SLEEM ; cathode lens mode Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering CEZ AV0Z20650511 - UPT-D (2005-2011) Annotation Employment of the scanning low energy electron microscopy (SLEEM) has been slowly making its way into the field of materials science, hampered not by limitations in the technique but rather by the relative scarcity of these instruments in research institutes and laboratories. Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2012
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