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Detection of Elliptical Particles in Atomic Force Microscopy Images
- 1.Sedlář, J., Zitová, B., Kopeček, J., Todorciuc, T., Kratochvílová, I. Detection of Elliptical Particles in Atomic Force Microscopy Images. In: ICASSP 2011: IEEE International Conference on Acoustics, Speech, and Signal Processing. Praha: IEEE, 2011, s. 1233-1236. ISBN 978-1-4577-0539-7. Available: doi: 10.1109/ICASSP.2011.5946633.
Number of the records: 1