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Development of EOD for the design in electron and ion microscopy
- 1.0358560 - ÚPT 2012 RIV NL eng J - Journal Article
Zlámal, J. - Lencová, Bohumila
Development of EOD for the design in electron and ion microscopy.
Nuclear Instruments & Methods in Physics Research Section A. Roč. 654, č. 1 (2011), s. 278-282. ISSN 0168-9002. E-ISSN 1872-9576
R&D Projects: GA AV ČR IAA100650805
Institutional research plan: CEZ:AV0Z20650511
Keywords : finite element method * tolerancing * user interface
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.207, year: 2011
The paper surveys new features of the EOD program, a complete workplace for the design of electron and ion microscopes. The extensions of the program for space charge computations, interaction with gases in the specimen chamber and misalignments are handled as plug-ins, keeping the program as a single unit. The current status of the tolerancing plug-in is described in more detail.
Permanent Link: http://hdl.handle.net/11104/0196559
Number of the records: 1