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Scanning probe microscopy on organic heterostructures for photovoltaics
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SYSNO ASEP 0356027 Document Type C - Proceedings Paper (int. conf.) R&D Document Type The record was not marked in the RIV Title Scanning probe microscopy on organic heterostructures for photovoltaics Author(s) Čermák, Jan (FZU-D) RID, SAI, ORCID
Rezek, Bohuslav (FZU-D) RID, ORCID
Ledinský, Martin (FZU-D) RID, ORCID, SAI
Cimrová, Věra (UMCH-V) RID, ORCID
Fejfar, Antonín (FZU-D) RID, ORCID, SAISource Title Proceedings of The Third International Forum on Multidisciplinary Education and Research for Energy Science. - Tokyo : Tokyo Institute of Technology Global COE Program, 2010 / Hirai S. ; Maruyama T. - ISBN N Pages s. 167-168 Number of pages 2 s. Action International Forum on Multidisciplinary Education and Research for Energy Science /3./ Event date 09.12.2010-14.12.2010 VEvent location Ishigaki, Okinawa Country JP - Japan Event type WRD Language eng - English Country JP - Japan Keywords probe miscroscopic techniques ; organic heterostructures Subject RIV BM - Solid Matter Physics ; Magnetism CEZ AV0Z10100521 - FZU-D (2005-2011) AV0Z40500505 - UMCH-V (2005-2011) Annotation Various scanning probe microscopic techniques were applied to organic heterostructures. The heterostructures are donor-acceptor system for photovoltaics. It has been proven, that correlation of atomic force microscopy (AFM), Kelvin force microscopy (KFM), mapping of micro-Raman scattering and current-sensing AFM can identify problematic areas of the heterostructures. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2011
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