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Limits of applicability of a time-of-flight ion-mass analyzer in uncovering partial currents of ions emitted by pulsed laser ion sources

  1. 1.
    SYSNO0352581
    TitleLimits of applicability of a time-of-flight ion-mass analyzer in uncovering partial currents of ions emitted by pulsed laser ion sources
    Author(s) Krása, Josef (FZU-D) RID, ORCID
    Láska, Leoš (FZU-D)
    Rohlena, Karel (FZU-D) RID
    Velyhan, Andriy (FZU-D) RID, ORCID
    Czarnecka, A. (PL)
    Parys, P. (PL)
    Ryc, L. (PL)
    Wolowski, J. (PL)
    Source Title Radiation Effects and Defects in Solids. Roč. 165, 6-10 (2010), s. 441-450. - : Taylor & Francis
    Document TypeČlánek v odborném periodiku
    Grant LC528 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic
    IAA100100715 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
    228334, XE - EU countries
    CEZAV0Z10100523 - FZU-D (2005-2011)
    Languageeng
    CountryGB
    Keywords laser-produced plasma * time-resolved current deconvolution * ion velocity distribution * drift velocity of ions
    Permanent Linkhttp://hdl.handle.net/11104/0192061
     
Number of the records: 1  

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