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Limits of applicability of a time-of-flight ion-mass analyzer in uncovering partial currents of ions emitted by pulsed laser ion sources
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SYSNO ASEP 0352581 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Limits of applicability of a time-of-flight ion-mass analyzer in uncovering partial currents of ions emitted by pulsed laser ion sources Author(s) Krása, Josef (FZU-D) RID, ORCID
Láska, Leoš (FZU-D)
Rohlena, Karel (FZU-D) RID
Velyhan, Andriy (FZU-D) RID, ORCID
Czarnecka, A. (PL)
Parys, P. (PL)
Ryc, L. (PL)
Wolowski, J. (PL)Source Title Radiation Effects and Defects in Solids. - : Taylor & Francis - ISSN 1042-0150
Roč. 165, 6-10 (2010), s. 441-450Number of pages 10 s. Language eng - English Country GB - United Kingdom Keywords laser-produced plasma ; time-resolved current deconvolution ; ion velocity distribution ; drift velocity of ions Subject RIV BL - Plasma and Gas Discharge Physics R&D Projects LC528 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) IAA100100715 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) CEZ AV0Z10100523 - FZU-D (2005-2011) UT WOS 000281854500007 DOI 10.1080/10420151003718402 Annotation The emission of Fe ions and ionized admixtures of silicon, carbon, oxygen and hydrogen generated by a Nd:YAG laser (I ≈ 1x10^10 W/cm^2) is investigated with the use of ion collectors (IC) and a cylindrical electrostatic ion mass analyzer (CEA). The partial currents of ion species are reconstructed from a set of CEA spectra obtained by changing the voltage between the CEA's cylindrical deflecting plates. The basic difference between the sum of all the reconstructed partial currents and the corresponding IC current is analyzed and the reasons for differences are specified. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2011
Number of the records: 1