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Scanning Low Energy Electron Microscopy - A PowerfuleTool for Materials Science
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SYSNO ASEP 0352510 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title Scanning Low Energy Electron Microscopy - A PowerfuleTool for Materials Science Author(s) Mikmeková, Šárka (UPT-D) RID, SAI, ORCID
Matsuda, K. (JP)
Watanabe, K. (JP)
Mizutani, M. (JP)
Narukawa, Y. (JP)
Müllerová, Ilona (UPT-D) RID, SAI, ORCID
Frank, Luděk (UPT-D) RID, SAI, ORCIDNumber of authors 7 Source Title Proceedings of 5th Japan-China-Norway Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology. - Toyama : University of Toyama, 2010 - ISBN 978-4-9903248-2-7 Pages s. 77-78 Number of pages 2 s. Action JCNCS2010 /5./ Japan-China-Norway Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology Event date 12.09.2010-15.09.2010 VEvent location Toyama Country JP - Japan Event type WRD Language eng - English Country JP - Japan Keywords scanning low energy electron microscopy ; AZ 91 ; AZ 96 ; UFG Al ; matal matrix composite materials Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering CEZ AV0Z20650511 - UPT-D (2005-2011) Annotation Progress in materials research is inseparably connected to the development of new analytical methods, which make it possible to examine. The aging hardness the structures of materials at high spatial resolution and sensitivity. A very promising technique for study the microstructure of advanced materials is the scanning low energy electron microscopy (SLEEM). Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2011
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