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Effects of Ni+ ion implantation and post annealing in PEEK, PET and PI: the morphology, the microstructure and the electric properties
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SYSNO 0351882 Title Effects of Ni+ ion implantation and post annealing in PEEK, PET and PI: the morphology, the microstructure and the electric properties Author(s) Macková, Anna (UJF-V) [ONF] RID, ORCID, SAI
Malinský, Petr (UJF-V) [ONF] RID, ORCID, SAI
Hnatowicz, Vladimír (UJF-V) [ONF] RID
Khaibullin, R. I. (RU)
Slepička, P. (CZ)
Švorčík, V. (CZ)
Šlouf, Miroslav (UMCH-V) [MATER] RID, ORCID
Peřina, Vratislav (UJF-V) [ONF] RIDSource Title 17th International conference on ion beam modification of materials, book of abstracts, P2-4-146. Roč. 2010 (2010), s. 127-127. - 2010 Conference 17th international conference on ion beam modification of materials, Montreal, 22.08.2010-27.08.2010 Document Type Abstrakt Grant KAN400480701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR), CZ - Czech Republic GA106/09/0125 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z10480505 - UJF-V (2005-2011) AV0Z40500505 - UMCH-V (2005-2011) Language eng Country CA Keywords Ni ion implantation * polymers * depth profiles * RBS * TEM * AFM Permanent Link http://hdl.handle.net/11104/0191527
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