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Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates
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SYSNO 0338185 Title Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates Title Fourierovské fotovodivostní měření tenkých vrstev amorfního křemíku na hrubých opticky neprůhledných a vodivých substrátech Author(s) Holovský, Jakub (FZU-D) RID, ORCID
Ižák, T. (SK)
Poruba, Aleš (FZU-D) RID
Vaněček, Milan (FZU-D) RID
Hamers, E.A.G. (NL)Source Title ICANS23 - 23rd International Conference on Amorphous and Nanocrystaline Semiconductors. Book of Abstracts. S. 332-332. - Utrecht : Utrecht University, 2009 Conference International Conference on Amorphous and Nanocrystaline Semiconductors /23./ (ICANS23), 23.08.2009-28.08.2009, Utrecht Document Type Abstrakt Grant GA202/09/0417 GA ČR - Czech Science Foundation (CSF) 38885, XE - EU countries CEZ AV0Z10100521 - FZU-D (2005-2011) Language eng Country NL Keywords thin film silicon * photoconductivity * optical modeling Permanent Link http://hdl.handle.net/11104/0182026
Number of the records: 1