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Sub-micron focusing of soft x-ray free electron laser beam
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SYSNO 0336002 Title Sub-micron focusing of soft x-ray free electron laser beam Title Mikrofokusace svazku měkkého rentgenového laseru s volnými elektrony Author(s) Bajt, S. (DE)
Chapman, H.N. (DE)
Nelson, A.J. (US)
Lee, R. W. (US)
Toleikis, S. (DE)
Mirkarimi, P. (US)
Alameda, J.B. (US)
Baker, S. L. (US)
Vollmer, H. (US)
Graff, R.T. (US)
Aquila, A. (US)
Gullikson, E.M. (US)
Meyer Ilse, J. (US)
Spiller, E.A. (US)
Krzywinski, J. (US)
Juha, Libor (FZU-D) RID, ORCID, SAI
Chalupský, Jaromír (FZU-D) RID, ORCID
Hájková, Věra (FZU-D) RID, ORCID
Hajdu, J. (SE)
Tschentscher, T. (DE)Source Title Damage to VUV, EUV, and X-ray Optics II. 73610J/1-73610J/10. - Bellingham : SPIE, 2009 / Juha L. ; Bajt S. ; Sobierajski R. Conference Damage to VUV, EUV, and X-Ray Optics II, Prague, 21.04.2009-23.04.2009 Document Type Konferenční příspěvek (zahraniční konf.) Grant KAN300100702 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) LC510 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) LC528 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic LA08024 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) IAA400100701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) CEZ AV0Z10100523 - FZU-D (2005-2011) Language eng Country US Keywords microfocuses * multilayer mirror * free electron laser beam URL http://dx.doi.org/10.1117/12.822498 Permanent Link http://hdl.handle.net/11104/0180334
Number of the records: 1